Total Solution for Semiconductor IC Test Socket, Spring Contact Probe, WLP Probe Card, ATE Load Board, Burn-in Test Scoket

Qualmax Provides Battery Contact Probe 

Double-ended Probe, Single-ended Probe, Solid Pd Alloy Probe, Constant Cres Probe,
Coaxial Probe, Kelvin Probe, Switching Probe, Touch Probe, GT Probe, Battery Contact,
Pneumatic Probe, Interface Probe, Industrial Application Probe, In-Circuit Test Probe

BatteryTest Probe / Battery Charge Probe

Qualmax battery contact probe is used in the mobile electronics industry to charge or
test the batteries. Current carrying capacity is 6 to 15 Amps continuous for optimal operation.
Spring contact probes are viable alternative to bent metal contacts because of its excellent
electrical performance and the durability. It is also widely used as the electrical interfaces in the
telecommunication, medicine, aerospace industry due to its proven reliability.

picture of a battery charge probe CH014A

picture of a battery charge probe CH250R

picture of a battery test probe CA101  

picture of a battery test probe CA233CC    

 

   

 

 

Special Sale:
See our inventory liquidation sale. Huge savings!

New Products

Micro Conctact Vertical Probe Card (MCVPC) for Wafer Level Package Test

Solid Pd Alloy Probes for Critical Lead Free Applications

RF Coaxial Test Socket

BK Series Elastomeric Socket     

Press Release:Qualmax now offers design engineering support in the U.S.

Download Qualmax Corporate Brochure

See us at International Test Conference 2010

See us at BITS 2010

 

Please e-mail to info@qualmax.com for your Semciconductor Test Socket or Spring Contact Probe needs.
Qualmax provides Semiconductor Test Socket, Spring Contact Probe, WLP Probe Card, Burn-in Test
Socket
and ATE Load Board (DUT Board)  to the semiconductor test industry.