Total Solution for Semiconductor IC Test Socket, Spring Contact Probe, Wafer Probe Card, ATE Load Board, Burn-in Socket and High Density Coaxial Connector

Qualmax provides very thin Coaxial Cable & Coaxial Probe for Semiconductor Test Application

Double-ended Probe    Single-ended Probe    Solid Pd Alloy Probe    Coaxial Probe     Kelvin Probe

Battery Contact    Interface Probe     In-Circuit Test Probe

Coaxial Probe and Coaxial Cable

Today's IC test often requires very thin coaxial cable not only for the handling of RF
signals, but also for seamless signal intergrity
 between DUT and the ATE. Qualmax
provides high quality coaxial probes and coaxial cables to serve those applications.

Features 

  • Optimized Impedance for high power, high voltage, low attenuation applications
  • Impedance matching : 50 Ohms +/- 10%
  • Minimal signal leakage
  • Certified by major ATE manufacturers
  • Very thin (cable thickness: 1.0mm to 2.0mm), very flexible
  • Coaxial probes are produced and assembled in-house
  • Individually shield plungers
  • Plunger tips are replaceable in the field
  • Custom designs are welcome including coaxial connector block
  • Fast delivery for minimal time-to-market
  • Just call us. We will design for you from your specification at no charge

Coaxial Cable with replacable Coaxial Probe

Coaxial Cable with replacable Coaxial Probe
  


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Special Sale:
See our inventory liquidation sale. Huge savings!

New Products

Solid Pd Alloy Probes  

RF Coaxial Test Socket

Elastomeric Socket     

Press Releases

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Trade Shows

See us at BITS 2012

See us at SWTW 2012

 

 

Please e-mail to info@qualmax.com for your Semciconductor Test Socket or Spring Contact Probe needs.
Qualmax provides Semiconductor Test Socket, Spring Contact Probe, WLP Probe Card, Burn-in Test
Socket
and ATE Load Board (DUT Board)  to the semiconductor test industry.