Total Solution for Semiconductor IC Test Socket, Spring Contact Probe, WLP Probe Card, ATE Load Board, Burn-in Test Scoket

Constant Contact Resistance Spring Contact Probe from Qualmax

Dubble-ended Probe, Single-ended Probe, Solid Pd Alloy Probe, Constant Cres Probe,
Coaxial Probe, Kelvin Probe, Switching Probe, Touch Probe, GT Probe, Battery Contact,
Pneumatic Probe, Interface Probe, Industrial Application Probe, In-Circuit Test Probe

Electro-formed Barrel Probe: GN Series

Usually spring probe barrels are made either by machining pre-formed pipes or by deep-drawing.
As miniaturization progresses, however, both technique have drawbacks in terms of contact resistance
Stability. Leeno have developed a proprietary method to make very small barrels using electro-forming
process, in which the barrel material is electronically deposited or built-up from electrolytic solution,
and thus gives excellent inside surface characteristics as shown below.  

Features

  • No electroplating is required for the barrel
  • Very low contact resistance
  • Very stable contact resistance throughout the life span
  • Minimal solder migration
  • Proprietary barrel manufacturing process
  • Barrel diameter : from 0.08mm (0.003") to 0.38mm (0.015")
  • Can be either DB Type or GX Type depends on application
  • Custom designs are welcome
  • Just call us. We will design for you from your specification at no charge
  • Sample delivery within 2 weeks aro
  • Down to 0.12mm pitch
  • Spring force as small as 2.8g
  • Excellent for RF applications
  • Following parts are just a show case

  Barrel Size

Pitch 

 Part No.

Double-ended Probe    
 0.08 mm  0.12 mm  GN008AA 
 0.10 (0.11) mm  0.15 mm   GN010AA-5.0GN011AA-7.6GN011AA-6.8GN011AA
 0.15 (0.155) mm  0.20 mm  GN015AAGN015CA-6.85,  GN015CA-4.3
 0.21 (0.20) mm  0.30 mm  GN126CCGN116AMA-R2GN137CARGN021AA 
 0.26 mm  0.35 mm  GN026AAGN133ACARGN139AAR-TSK
 0.31 mm  0.40 mm  GN105CARGN106CARGN107CARGN108CARGN109CAR
 0.35 mm  0.50 mm  GN127AMRGN141CARGN128CAR
 0.38 mm  0.50 mm  GN101CARGN102CARGN103AMRGN104CARGN115CAR
Single-ended Probe     
 0.10 (0.11) mm  0.15 mm  GN118CA-DGN120CA-D
 0.15 (0.155) mm  0.20 mm  GN114CA-DGN125CA-D
 0.31 mm  0.40 mm  GN138CAR-DGN129AAR-DTPSK
 0.35 mm  0.50 mm  GN136CC-DTPD
 0.38 mm  0.50 mm  GN135CAR-D

 

 

Comparison between GN Series Barrel vs. Au Clad Barrel


comparison between electroformed barrel and gold clad barrel  

contact resistance comparison over the probe life span

   

 

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Solid Pd Alloy Probes for Critical Lead Free Applications

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Please e-mail to info@qualmax.com for your Semciconductor Test Socket or Spring Contact Probe needs.
Qualmax provides Semiconductor Test Socket, Spring Contact Probe, WLP Probe Card, Burn-in Test
Socket
and ATE Load Board (DUT Board)  to the semiconductor test industry.