Total Solution for Semiconductor IC Test Socket, Spring Contact Probe, WLP Probe Card, ATE Load Board, Burn-in Test Scoket

Qualmax - Proven Full Service Company for Semiconductor IC Test Socket, Burn-in Test Socket, ATE Load Board, WLP Probe Card & Spring Contact Probe

Semiconductor IC Test Socket,  Burn-in Test Socket,  ATE Load BoardWLP Probe Card,  Spring Contact Probe

Contact Information

 Qualmax America, Inc. Qualmax, Inc.          
   
 Main Office:  Main Office:
 1481 W. Warm Springs Rd.  IT Castle 1-dong, 1101-ho
 Suite 141  550-1 Gasan-dong, Geumcheon-gu,
 Henderson, NV 89014  Seoul, Korea 153-768
 United States of America  
 Phone: 702-242-1101  Phone: 82-2-2082-6770
 Fax: 702-388-1101  Fax: 82-2-2082-6778
   


Sales & Service Contacts

Jongkook Choi
President/CEO
Cell 1-201-245-2077 (U.S.A.)
82-10-3719-7680 (Korea)
e-mail: jchoi@qualmax.com

Gordon LaPorte
Qualmax America, Inc.
Vice President/GM
Office 1-925-252-9611
Cell 1-925-997-0709
e-mail: glaporte@qualmax.com

Kathy Britt
Qualmax America, Inc.
Inside Sales
Office 1-717-667-9044
Fax 1-717-667-3688
e-mail: kbritt@qualmax.com

Rina Ahn
Qualmax, Inc.
Inside Sales
Cell 82-11-898-8873
e-mail: rina@qualmax.com


Singapore

Nisa Pte. Ltd.
8 Boon Lay Way
# 10-16 Tradehub 21
Singapore 609964

S.K. Low
Phone : 65-6316-4454
Cell  : 65-9066-6608
e-mail:
sales@nisa.sg

 

 

     

 

 

Special Sale:
See our inventory liquidation sale. Huge savings!

New Products

Micro Conctact Vertical Probe Card (MCVPC) for Wafer Level Package Test

Solid Pd Alloy Probes for Critical Lead Free Applications

RF Coaxial Test Socket

BK Series Elastomeric Socket     

Press Release:Qualmax now offers design engineering support in the U.S.

Download Qualmax Corporate Brochure

See us at International Test Conference 2010

See us at BITS 2010

 

Please e-mail to info@qualmax.com for your Semciconductor Test Socket or Spring Contact Probe needs.
Qualmax provides Semiconductor Test Socket, Spring Contact Probe, WLP Probe Card, Burn-in Test
Socket
and ATE Load Board (DUT Board)  to the semiconductor test industry.