Total Solution for Semiconductor IC Test Socket, Spring Contact Probe, WLP Probe Card, ATE Load Board, Burn-in Test Scoket

Qualmax - Proven Full Service Company for Spring Contact Probe (Pogo Pin)

Dibble-ended Probe, Single-ended Probe, Solid Pd Alloy Probe, Constant Cres Probe,
Coaxial Probe, Kelvin Probe, Switching Probe, Touch Probe, GT Probe, Battery Contact,
Pneumatic Probe, Interface Probe, Industrial Application Probe, In-Circuit Test Probe

Double-ended Spring Probe : DB Series

  • DB Type probes are four-piece probes consisting of a top plunger, a bottom plunger, a barrel and
    a miniature spring going into the barrel.
  • Custom designs are welcome
  • Just call us. We will design for you from your specification at no charge
  • Sample delivery within 2 weeks aro
  • Upto 0.25mm pitch
  • Barrel diameter as small as 0.08mm
  • Spring force as small as 2.8g
  • Following parts are just a show case



PART. NO Total length Pitch[mm(inch)] Barrel Dia [mm(inch)] Spring Force [g(oz)]
DB010AA-5.0L 5.0mm Fine pitch 0.11mm [0.004] 2.8g(0.098oz) at 0.5mm
DB011AA 9.4mm Fine pitch 0.115mm [0.0045] 3.1g(0.109oz) at 0.6mm
DB015CA-4.3 4.3mm Fine pitch 0.15mm [0.0059] 5.1g(0.18oz) at 0.3mm
DB015AA-90 9.8mm Fine pitch 0.155mm [0.0061] 5.2g(0.183oz) at 0.7mm
DB335AA 5.7mm 0.4~0.5mm 0.21mm [0.0083] 10.8g(0.381oz) at 0.65mm
DB020AA-9.7 9.7mm 0.4~0.5mm 0.20mm [0.008] 6.1g(0.215oz) at 0.8mm
DB440CAR-20G 5.28mm 0.4~0.5mm 0.26mm [0.0102] 20.0g(0.705oz) at 0.5mm
DB620AA 5.7mm 0.4~0.5mm 0.26mm [0.0102] 13.5g(0.476oz) at 0.65mm
DB273CAR 2.55mm 0.4~0.5mm 0.31mm [0.0122] 18.0g(0.635oz) at 0.45mm
DB328CAR-R1 4.15mm 0.4~0.5mm 0.31mm [0.0122] 21.1g(0.744oz) at 0.4mm
DB605CAR 4.75mm 0.4~0.5mm 0.31mm [0.0122] 21.1g(0.744oz) at 0.6mm
DB445CC 5.7mm 0.4~0.5mm 0.31mm [0.0122] 20.3g(0.716oz) at 0.5mm
DB030AA 9.7mm 0.4~0.5mm 0.30mm [0.0118] 6.4g(0.226oz) at 0.8mm
DB311CAR 2.0mm 0.4~0.5mm 0.35mm [0.0138] 18.5g(0.653oz) at 0.3mm
DB337CAR 5.6mm
0.4~0.5mm 0.35mm [0.0138]
28.0g(0. 988oz) at 0.64mm
DB313AMAR 7.62mm 0.4~0.5mm 0.35mm [0.0138] 19.5g(0.688oz) at 0.63mm
DB472CAR-25G 3.2mm 0.4~0.5mm 0.38mm [0.015] 25.2g(0.889oz) at 0.45mm
DB470CAM-R8 4.6mm 0.4~0.5mm 0.38mm [0.015] 22.2g(0.783oz) at 0.6mm
DB235CAR 5.7mm 0.4~0.5mm 0.38mm [0.015] 30.0g(1.058oz) at 0.75mm
DB398CAR 5.7mm 0.4~0.5mm 0.38mm [0.008]
24.5g(0.864oz) at 0.65mm
DB611CAR 3.7mm 0.65~0.85mm 0.51mm [0.0201] 23.5g(0.828oz) at 0.7mm
DB330CAR 4.8mm 0.65~0.85mm 0.51mm [0.0201] 31.8g(1.122oz) at 0.65mm
DB525CAR 5.7mm 0.65~0.85mm 0.51mm [0.0201] 23.0g(0.811oz) at 0.65mm
DB280CAR-3.0L 3.0mm 0.65~0.85mm 0.57mm [0.0224] 30.6g(1.079oz) at 0.5mm
DB461CAM 3.1mm 0.65~0.85mm 0.57mm [0.0224] 25.0g(0.882oz) at 0.5mm
DB229CAR 4.8mm 0.65~0.85mm 0.57mm [0.0224] 33.0g(1.164oz) at 0.6mm
DB405CAR 5.7mm 0.65~0.85mm 0.58mm [0.0228] 25.0g(0.882oz) at 0.65mm
DB177CAR-R2 3.3mm 0.65~0.85mm 0.62mm [0.0244] 29.0g(1.023oz) at 0.55mm
DB674AR2 5.81mm 1.0~1.27mm 0.61mm [0.024] 40.3g(1.421oz) at 0.72mm
DB302CC 8.65mm 1.0~1.27mm 0.75mm [0.0295] 28.0g(0.988oz) at 1.0mm
DB305CAR-R2 3.3mm 1.0~1.27mm 0.81mm [0.0319] 29.0g(1.023oz) at 0.72mm
DB420CAR-SP 6.57mm 1.0~1.27mm 0.80mm [0.0315] 13.8g(0.487oz) at 1.18mm
DB274CAM
2.9mm 1.0~1.27mm 0.86mm [0.0339] 20.8g(0.734oz) at 0.45mm
DB190CAR 5.8mm 1.0~1.27mm 0.84mm [0.0331] 30.6g(1.097oz) at 0.70mm
DB197CAM 8.68mm 1.27mm 1.0mm [0.0394] 29.3g(1.034oz) at 1.4mm

 

   

 

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Please e-mail to info@qualmax.com for your Semciconductor Test Socket or Spring Contact Probe needs.
Qualmax provides Semiconductor Test Socket, Spring Contact Probe, WLP Probe Card, Burn-in Test
Socket
and ATE Load Board (DUT Board)  to the semiconductor test industry.