Total Solution for Semiconductor IC Test Socket, Spring Contact Probe, WLP Probe Card, ATE Load Board, Burn-in Test Scoket

About Qualmax

Spring Contact Probe Double-ended Probe Single-ended Probe Solid Pd Alloy Probe Constant Cres Probe Coaxial Probe Kelvin Probe Switching Probe Touch Probe GT Probe Battery Contact Probe Pneumatic Probe Interface Probe Industrial Applications In-circuit Test Probe Pogo Pin Search

Semiconductor Test Socket

Burn-in Test Socket

ATE Load Board

WLP Probe Card

What We Offer

Semiconductor Test Socket
Elastomeric sockets
Burn-in Test Socket
ATE Load Board
WLP Probe Card
Spring Contact Probe
Test Socket Lid
Custom Support Plate
Change Kit
Application Engineering
Free Custom Design
Technical Support
Local Stocking of Inventory
Supports JIT Manufacturing
Quality Standard Set-up

Our Commitment

Product Excellence
In-depth Application Consulting
Intelligent Design Engineering
Precision Manufacturing
Stringent Quality Control
Two-week Goal for ;
- Design Completion
- Prototype Delivery
- Mass Production Delivery
No NRE Charge
No Tooling Charge
Flexible Approach
Goal Oriented Customer Care

Benefits for You

Highest Quality Product
Best Test Yield
Shortest Lead Time
Shortest Time-to-Market
Competitive Price
Intensive Local Support
One Stop Total Solution

Qualmax provides Miniature Spring Contact Probe for Connector Industry

Dubble-ended Probe, Single-ended Probe, Solid Pd Alloy Probe, Constant Cres Probe,
Coaxial Probe, Kelvin Probe, Switching Probe, Touch Probe, GT Probe, Battery Contact,
Pneumatic Probe, Interface Probe, Industrial Application Probe, In-Circuit Test Probe

GT Probe

GT Series spring contact probes are used for various industrial applications including connector manufacturing.
Thanks to its small mechanical size and the high current carrying capability, it can be used for wide range of
applications where the space and the electrical perfomance are crucial. GT Series probes have the same level of
long life span as that of semiconductor probes from Leeno Industrial.

picture of a spring contact probes used for connector manufacturing

picture of GT probe GT100T

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Special Sale:
See our inventory liquidation sale. Huge savings!

New Products

Micro Conctact Vertical Probe Card (MCVPC) for Wafer Level Package Test

Solid Pd Alloy Probes for Critical Lead Free Applications

RF Coaxial Test Socket

BK Series Elastomeric Socket

Press Release:Qualmax now offers design engineering support in the U.S.

Download Qualmax Corporate Brochure

See us at International Test Conference 2010

See us at BITS 2010

Please e-mail to info@qualmax.com for your Semciconductor Test Socket or Spring Contact Probe needs.
Qualmax provides Semiconductor Test Socket, Spring Contact Probe, WLP Probe Card, Burn-in Test
Socket and ATE Load Board (DUT Board) to the semiconductor test industry.

Qualmax provides Miniature Spring Contact Probe for Connector Industry

Dubble-ended Probe, Single-ended Probe, Solid Pd Alloy Probe, Constant Cres Probe, Coaxial Probe, Kelvin Probe, Switching Probe, Touch Probe, GT Probe, Battery Contact, Pneumatic Probe, Interface Probe, Industrial Application Probe, In-Circuit Test Probe

GT Probe

Dubble-ended Probe, Single-ended Probe, Solid Pd Alloy Probe, Constant Cres Probe,
Coaxial Probe, Kelvin Probe, Switching Probe, Touch Probe, GT Probe, Battery Contact,
Pneumatic Probe, Interface Probe, Industrial Application Probe, In-Circuit Test Probe