Total Solution for Semiconductor IC Test Socket, Spring Contact Probe, WLP Probe Card, ATE Load Board, Burn-in Test Scoket

Qualmax supplies field-proven In-circuit Test (ICT) Probe and Receptacle

Double-ended Probe, Single-ended Probe, Solid Pd Alloy Probe, Constant Cres Probe,
Coaxial Probe, Kelvin Probe, Switching Probe, Touch Probe, GT Probe, Battery Contact,
Pneumatic Probe, Interface Probe, Industrial Application Probe, In-Circuit Test Probe

In-circuit Test (ICT) Probe and Receptacle         picture of in-circuit test probe                           picture of different spring probe types


Qualmax offers a full line of field-proven Leeno in-circuit test probes and receptacles for PC board
industry. Since early eighties, Leeno has been one of the major ICT probe manufacturers in Asia, and
now no one doubts that the quality is at the top level among the major players in the world.

All probes are produced in-house and non of the manufacturing process is out-sourced, which makes
Leeno a true spring contact probe manufacturer, but not an assembler. The quality standard is as tight
as that of semiconductor test probes, and all probes are fully characterized before shipment.  

 

PART. NO Total length Pitch[mm(inch)] Barrel Dia [mm(inch)] Spring Force [g(oz)]
G020 series 13.3mm 0.45 (0.018) 0.21 (0.008) 7.0g(0.254oz) at 0.7mm
G026 series 13.3mm 0.50 (0.020) 0.26 (0.010) 18.0g(0.635oz) at 0.7mm
G030 series 18.5mm 0.55 (0.022) 0.31 (0.012) 27.0g(0.952oz) at 1.5mm
G040 series 14.5mm 0.65 (0.025) 0.38 (0.015) 44.0g(1.552oz) at 1.3mm
G042 series 19.0mm 0.80 (0.030) 0.42 (0.017) 36.0g(1.27oz) at 1.30mm
G050 series 15.5mm 0.80 (0.030) 0.51 (0.020) 40.0g(1.418oz) at 1.70mm
G070 series 16.35mm 1.27 (0.050) 0.68 (0.027) 70.0g(2.471oz) at 1.77mm
G070L series 28.6mm 1.27 (0.050) 0.68 (0.027) 70.0g(2.471oz) at 2.80mm
GL070 series 27.7mm 1.27 (0.050) 0.70 (0.028) 196.0g(6.914oz) at 3.0mm
G095 series 41.0mm 1.27 (0.050) 0.68 (0.027) 78.0g(2.753oz) at 4.3mm
GS105 series 23.15mm 1.91 (0.075) 1.02 (0.040) 105.0g(3.707oz) at 2.40mm
G105 series 24.9mm 1.91 (0.075) 1.02 (0.040) 125.0g(4.413oz) at 3.30mm
GSS135 series 23.65mm 2.54 (0.100) 1.36 (0.054) 105.0g(3.707oz) at 2.40mm
GS135 series 26.0mm 2.54 (0.100) 1.36 (0.054) 170.0g(6.001oz) at 3.70mm
G135 series 34.0mm 2.54 (0.100) 1.36 (0.054) 170.0g(6.001oz) at 4.30mm
G165 series 35.4mm 2.54 (0.100) 1.65 (0.065) 94.0g(3.318oz) at 5.10mm
G230 series 33.3mm 3.18 (0.125) 1.98 (0.078) 170.0g(6.001oz) at 4.30mm
G240 series 34.0mm 3.18 (0.125) 2.35 (0.093) 325.0g(11.47oz) at 4.30mm
G265 series 29.5mm 4.75 (0.187) 2.67 (0.105) 238.0g(8.401oz) at 3.70mm
G1003 series 32.8mm 1.91 (0.075) 1.0 (0.039) 105.0g(3.707oz) at 4.10mm
GL1003 series 55.0mm 1.91 (0.075) 1.02 (0.040) 170.0g(6.001oz) at 6.70mm
G1353 series 36.5mm 2.54 (0.100) 1.36 (0.054) 171.0g(6.036oz) at 4.00mm
GL1353 series 55.5mm 2.54 (0.100) 1.36 (0.054) 176.0g(6.213oz) at 7.30mm
S1353 series 55.5mm 3.18 (0.125) 1.65 (0.065) 193.0g(6.813oz) at 7.30mm
1353L series 54.5mm 3.96 (0.156) 1.98 (0.078) 340.0g(12.0oz) at 6.70mm

 

 

    

 

 

 

Special Sale:
See our inventory liquidation sale. Huge savings!

New Products

Micro Conctact Vertical Probe Card (MCVPC) for Wafer Level Package Test

Solid Pd Alloy Probes for Critical Lead Free Applications

RF Coaxial Test Socket

BK Series Elastomeric Socket     

Press Release:Qualmax now offers design engineering support in the U.S.

Download Qualmax Corporate Brochure

See us at International Test Conference 2010

See us at BITS 2010

 

Please e-mail to info@qualmax.com for your Semciconductor Test Socket or Spring Contact Probe needs.
Qualmax provides Semiconductor Test Socket, Spring Contact Probe, WLP Probe Card, Burn-in Test
Socket
and ATE Load Board (DUT Board)  to the semiconductor test industry.