Total Solution for Semiconductor IC Test Socket, Spring Contact Probe, Wafer Probe Card, ATE Load Board, Burn-in Socket and High Density Coaxial Connector

Qualmax Provides ATE Interface Ring and Interface Board

Double-ended Probe    Single-ended Probe    Solid Pd Alloy Probe    Coaxial Probe     Kelvin Probe

Battery Contact    Interface Probe     In-Circuit Test Probe

Interface Ring, Interface Probe

Qualmax provides custom designed spring contact probes for most demanding applications like test interface
ring, test interface board or pogo tower to make electrical connection in-between the DUT, ATE manipulator and 
the ATE test head. All products are thoroughly characterized for its signal path, cross-talk, bandwidth and
impedance with state-of-the-art measurement equipment before shipment to guarantee the best possible
performance.  

Custom designs are always welcome. The design turn-around time is less than a few days, and we can deliver
the first proto-type within 10 business days after the drawing approval.
 

picture of a ATE interface ring picture of a test interface for ATE equipment

 

 


Click this buttun to search your pogo pin in Qualmax data base.

   

 

 

 

 

Special Sale:
See our inventory liquidation sale. Huge savings!

New Products

Solid Pd Alloy Probes  

RF Coaxial Test Socket

Elastomeric Socket     

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Trade Shows

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Please e-mail to info@qualmax.com for your Semciconductor Test Socket or Spring Contact Probe needs.
Qualmax provides Semiconductor Test Socket, Spring Contact Probe, WLP Probe Card, Burn-in Test
Socket
and ATE Load Board (DUT Board)  to the semiconductor test industry.