Total Solution for Semiconductor IC Test Socket, Spring Contact Probe, WLP Probe Card, ATE Load Board, Burn-in Test Scoket

What We Offer

Semiconductor Test Socket
Elastomeric sockets
Burn-in Test Socket
ATE Load Board
WLP Probe Card
Spring Contact Probe
Test Socket Lid
Custom Support Plate
Change Kit
Application Engineering
Free Custom Design
Technical Support
Local Stocking of Inventory
Supports JIT Manufacturing
Quality Standard Set-up

Our Commitment

Product Excellence
In-depth Application  Consulting
Intelligent Design Engineering
Precision Manufacturing
Stringent Quality Control 
Two-week Goal for ;
  - Design Completion
  - Prototype Delivery
  - Mass Production Delivery
No NRE Charge
No Tooling Charge
Flexible Approach
Goal Oriented Customer Care

Benefits for You

Highest Quality Product
Best Test Yield
Shortest Lead Time
Shortest Time-to-Market
Competitive Price
Intensive Local Support
One Stop Total Solution

 

Qualmax Provides ATE Interface Ring and Interface Board

Double-ended Probe, Single-ended Probe, Solid Pd Alloy Probe, Constant Cres Probe, Coaxial Probe,
Kelvin Probe, Switching Probe, Touch Probe, GT Probe, Battery Contact, Pneumatic Probe, Interface Probe,
Industrial Application Probe, In-Circuit Test Probe

Interface Ring, Interface Probe

Qualmax provides custom designed spring contact probes for most demanding applications like test interface
ring, test interface board or pogo tower to make electrical connection in-between the DUT, ATE manipulator and 
the ATE test head. All products are thoroughly characterized for its signal path, cross-talk, bandwidth and
impedance with state-of-the-art measurement equipment before shipment to guarantee the best possible
performance.  

Custom designs are always welcome. The design turn-around time is less than a few days, and we can deliver
the first proto-type within 10 business days after the drawing approval. 

picture of a ATE interface ring picture of a test interface for ATE equipment

Probe Specifications:

picture of a test interface probe DB172AMAM 

 picture of test interface probe DB184AMAM & ST283RS

 

   

 

 

 

 

Special Sale:
See our inventory liquidation sale. Huge savings!

New Products

Micro Conctact Vertical Probe Card (MCVPC) for Wafer Level Package Test

Solid Pd Alloy Probes for Critical Lead Free Applications

RF Coaxial Test Socket

BK Series Elastomeric Socket     

Press Release:Qualmax now offers design engineering support in the U.S.

Download Qualmax Corporate Brochure

See us at International Test Conference 2010

See us at BITS 2010

 

Please e-mail to info@qualmax.com for your Semciconductor Test Socket or Spring Contact Probe needs.
Qualmax provides Semiconductor Test Socket, Spring Contact Probe, WLP Probe Card, Burn-in Test
Socket and ATE Load Board (DUT Board)  to the semiconductor test industry.

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