Qualmax provides Smallest Kelvin Probe for Semiconductor Test Socket

Dubble-ended Probe, Single-ended Probe, Solid Pd Alloy Probe, Constant Cres Probe,
Coaxial Probe, Kelvin Probe, Switching Probe, Touch Probe, GT Probe, Battery Contact,
Pneumatic Probe, Interface Probe, Industrial Application Probe, In-Circuit Test Probe

Kelvin Probe

As electronic devices become smaller and smaller it becomes increasingly difficult to automatically test a device with test probes.
Probes may be miniaturized to the same scale as the device under test in order to contact the device leads. However, it is often
difficult to produce a reliable probe that can withstand the rigors of use in an automated test fixture. Very small test probes have
a limited spring force and thus may not adequately penetrate the oxide layer of a device under test to make a good electrical
connection. That's reason why a good kelvin probe is needed.

Qualmax Kelvin Probe uses Hardened steel terminal (Au plated) for better penetration through the oxide layer of the pad under test,
and it can be spaced as small as 0.08mm (0.003") when it is installed in-line.

Typical application is illustrated below.