Total Solution for Semiconductor IC Test Socket, Spring Contact Probe, WLP Probe Card, ATE Load Board, Burn-in Test Scoket

Qualmax - Full Proven Service Company for Semiconductor IC Test Socket

BGA Socket / LGA SocketRF Device SocketSpecial SocketQFN Socket / MLF SocketPOP Socket /
PIP Socket
QFP SocketMemory Device SocketElastomeric Socket, Contactor LidCustom Support Plate, Change Kit 

Memory Device Test Socket 

  DDR2/DDR3 SDRAM SOCKET

* 60/84BGA 0.8p DDR2
* 82/100BGA 0.8p DDR3
* 54/66TSOP 0.5/0.65p SDRAM
* 165BGA 1.0p SDRAM
* 86TSOP 0.5p SDRAM
* System/Handler :
MAGNUM/STH5320, T5374/M6541, AL6095/STH5200
AN6050/STH5200, T5585/M6541, T5375/M6541

  NAND/NOR FLASH SOCKET

* 48TSOP-I 0.5p NAND FLASH
* 48USOP 0.5p NAND FLASH
* 48WSOP 0.5p NAND FLASH
* 48BGA 0.8p NOR FLASH

* System/Handler :
MAGNUM/STH5320, T5374/M6541
AN6050/STH5200, T5585/M6541, T5375/M6541


  GRAPHIC SOCKET

* 144BGA 0.8p GDDR
* 136BGA 0.8p GDDR2
* 136BGA 0.8p GDDR3
* System/Handler
T5501/M6542, T5593/M6542, T5593/M6542

 

MCP SOCKET (UNIVERSAL TYPE)

* 63/69/88/149 BGA 0.8p
* 109/137/167 BGA 0.8p
* 188/202 BGA 0.65p
* System/Handler T5375/M6541, T5581/M6741

 

 

 


  MEMORY CARD SOCKET

* MMC, RS-MMC
* XD CARD
* System/Handler T5375/M6541

  PoP Package SOCKET

* 128FBGA 0.65p
* 152FBGA 0.65p
* 136BGA 0.8p
* 160FBGA 0.5p

Qualmax also offers Burn-in Test Socket, ATE Load Board (DUT Board), WLP Probe Card and wide
range of
Spring Contact Probe.

 

     

 

Special Sale:
See our inventory liquidation sale. Huge savings!

New Products

Micro Conctact Vertical Probe Card (MCVPC) for Wafer Level Package Test

Solid Pd Alloy Probes for Critical Lead Free Applications

RF Coaxial Test Socket

BK Series Elastomeric Socket     

Press Release:Qualmax now offers design engineering support in the U.S.

Download Qualmax Corporate Brochure

See us at International Test Conference 2010

See us at BITS 2010

 

Please e-mail to info@qualmax.com for your Semciconductor Test Socket or Spring Contact Probe needs.
Qualmax provides Semiconductor Test Socket, Spring Contact Probe, WLP Probe Card, Burn-in Test
Socket
and ATE Load Board (DUT Board)  to the semiconductor test industry.