Total Solution for Semiconductor IC Test Socket, Spring Contact Probe, WLP Probe Card, ATE Load Board, Burn-in Test Scoket

Qualmax introduces a new approach to RF Device testing : Coaxial Test Sockets

Semiconductor IC Test Socket,  Burn-in Test Sockets,  ATE Load BoardWLP Probe Card,  Spring Contact Probe


RF Coaxial Test Sockets

 

semiconductor test socket clam-shell lid socket

 

Qualmax introduces a new RF Coaxial Test Sockets with custom designed test probes.  In the global, competitive RF market the need to reduce test time and minimize costs continues to increase.  Qualmax has been able to successfully address our customer¡¯s requirements in these areas.

 

Custom Coaxial Socket design will incorporate air dielectric or a solid dielectric depending on impedance matching criteria.  In addition to the actual socket design, the choice of test probe is vital to performance. Important to this effort is minimizing reactive components both inductive and capacitive.  Qualmax engineers are available to analyze and recommend the best products for your particular device.

 

With many years of test probe design that continue to address challenging criteria, Qualmax offers a selection of test probes that meet critical parameters needed for RF testing:

                 

             Less than 1.12 mm long,

             Less Than .51nH inductive reactance

             Less Than .35 pF capacitance

             Bandwidths greater than 25 Ghz

 

 

Our Test Sockets can be designed and manufactured for bench test and production test with controlled impedance interface boards. In today's market Qualmax recognizes the importance of minimizing the time to market.  We also understand the importance of providing quality sockets with exceptional price/performance.  We therefore offer the following to our customers.

 

* All product designs from Qualmax US based office locations

* Accomplished test socket design engineering with extensive experience

* No NRE on test socket designs or test probe designs

* 24 hour turn around time on custom probe designs

* RAPID  turn around time for sngle socket design

* Volume delivery of custom probes within 7 - 10 days

* Socket delivery within 12 days

 

With over 25 years of semiconductor experience, and offices in Nevada, California, Arizona as well Seoul, Korea, Qualmax will support your special test socket requirements in the US as well as provide direct customer support in your Asian Facilities.

 

Call Qualmax at 702- 242-1101 or log on at www.qualmax.com today to learn more about how we can help you with your RF testing requirements. 

For More Information, please contact:

Qualmax America, Inc.
1481 W. Warm Springs Rd.
Suite 141
Henderson, NV 89014
Phone: 702-242-1101
Fax : 702-388-1101
e-mail:
info@qualmax.com

     

 

Special Sale:
See our inventory liquidation sale. Huge savings!

New Products

Micro Conctact Vertical Probe Card (MCVPC) for Wafer Level Package Test

Solid Pd Alloy Probes for Critical Lead Free Applications

RF Coaxial Test Socket

BK Series Elastomeric Socket     

Press Release:Qualmax now offers design engineering support in the U.S.

Download Qualmax Corporate Brochure

See us at International Test Conference 2010

See us at BITS 2010

 

Please e-mail to info@qualmax.com for your Semciconductor Test Socket or Spring Contact Probe needs.
Qualmax provides Semiconductor Test Socket, Spring Contact Probe, WLP Probe Card, Burn-in Test
Socket
and ATE Load Board (DUT Board)  to the semiconductor test industry.