Total Solution for Semiconductor IC Test Socket, Spring Contact Probe, WLP Probe Card, ATE Load Board, Burn-in Test Scoket

Qualmax provides Pneumatic Spring Contact Probe for Function Test

Double-ended Probe, Single-ended Probe, Solid Pd Alloy Probe, Constant Cres Probe,
Coaxial Probe, Kelvin Probe, Switching Probe, Touch Probe, GT Probe, Battery Contact,
Pneumatic Probe, Interface Probe, Industrial Application Probe, In-Circuit Test Probe

Pneumatic Probe

Pneumatic probe is mainly used for functional test. It has similar construction to pneumatic cylinders, but the scale is
much smaller; t
he barrel of the probe, being the cylinder, and the plunger, being the piston. An¡°O¡± Ring, which is
mounted on a collar, seals air
pressure in the probe
; the collar can be regarded
as a fixed part of the plunger design. Electrical
continuity or signal transfer between the tip of the
probe and the wire clip terminal at the base of the
probe is attached
through a sliding metallic ring which guarantees a good electrical connection between the sliding plunger and the barrel.Unlike
conventional spring contact probes,
pneumatic probes achieve their contact force
through air pressure applied to
the probe, which is typically 6 bar.
 

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Qualmax' pneumatic probes are coming in three different plunger syles as shown below;

 

 

 

   

 

 

 

 

 

 

 

Special Sale:
See our inventory liquidation sale. Huge savings!

New Products

Micro Conctact Vertical Probe Card (MCVPC) for Wafer Level Package Test

Solid Pd Alloy Probes for Critical Lead Free Applications

RF Coaxial Test Socket

BK Series Elastomeric Socket     

Press Release:Qualmax now offers design engineering support in the U.S.

Download Qualmax Corporate Brochure

See us at International Test Conference 2010

See us at BITS 2010

 

Please e-mail to info@qualmax.com for your Semciconductor Test Socket or Spring Contact Probe needs.
Qualmax provides Semiconductor Test Socket, Spring Contact Probe, WLP Probe Card, Burn-in Test
Socket
and ATE Load Board (DUT Board)  to the semiconductor test industry.