Total Solution for Semiconductor IC Test Socket, Spring Contact Probe, Wafer Probe Card, ATE Load Board, Burn-in Socket and High Density Coaxial Connector

Qualmax provides Pneumatic Spring Contact Probe for Function Test

Double-ended Probe    Single-ended Probe    Solid Pd Alloy Probe    Coaxial Probe     Kelvin Probe

Switching Probe    Battery Contact     Pneumatic Probe    Interface Probe     In-Circuit Test Probe

Pneumatic Probe

Pneumatic probe is mainly used for functional test. It has similar construction to pneumatic cylinders, but the scale is
much smaller; t
he barrel of the probebeing the cylinder, and the plunger, being the piston. An ¡°O¡±  Ring, which is
mounted on a collar, seals air
pressure in the probe
; the collar can be regarded
as a fixed part of the plunger design. Electrical
continuity or signal transfer between the tip of the
probe and the wire clip terminal at the base of the
probe is attached
through a sliding metallic ring which guarantees a good electrical connection between the sliding plunger and the barrel.
Unlike
conventional spring contact probes
,
pneumatic probes achieve their contact force
through air pressure applied to
the probe, which is typically 6 bar.
 

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Solid Pd Alloy Probes  

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Please e-mail to info@qualmax.com for your Semciconductor Test Socket or Spring Contact Probe needs.
Qualmax provides Semiconductor Test Socket, Spring Contact Probe, WLP Probe Card, Burn-in Test
Socket
and ATE Load Board (DUT Board)  to the semiconductor test industry.