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Spring Contact Probe
Semiconductor Test Socket
Wafer Probe Card
High Density Coaxial Connector

What We Offer
Semiconductor Test Socket
Wafer Probe Card
Spring Contact Probe
Test Socket Lid
Custom Support Plate
Hight Density Coaxial Connector
Application Engineering
Free Custom Design
Technical Support
Local Stocking of Inventory
Supports JIT Manufacturing
Quality Standard Set-up

Our Commmitment
Product Excellence
In-depth ApplicationConsulting
Intelligent Design Engineering
Precision Manufacturing
Stringent Quality Control
Two-week Goal for ;
 - Design Completion
 - Prototype Delivery
 - Mass Production Delivery
No NRE Charge
No Tooling Charge
Flexible Approach
Goal Oriented Customer Care

Benefits for You
Highest Quality Product
Best Test Yield
Shortest Lead Time
Shortest Time-to-Market
Competitive Price
Intensive Local Support
One Stop Total Solution

 

New pogo pins are on sale. Great selection. Upto 75% offf. Visit our Online Store.

Wafer Probe Card 

Wafer Level Package (WLP) gains more and more popularity in the electronics industry because of its size, weight and signal integrity. The main driver is the mobile equipment right now, but it will also be adapted by other products which require shorter signal path and higher frequency characteristics.

  • Down to 50 microns Pitch
  • All Vertical Probing
  • MEMS Techonolgy
  • Deep Silicone Etching
  • Proprietary Space Transformer/Interposer/RDL
  • All In-house Fabrication

Image of WLCSP Probe Card  X-Ray image of a TSV Probe Card image of RDL
    Wafer Probe Card                 WLCSP Card  X-Ray Image                   RDL

 

 

Total Solution for Semiconductor Test Socket, Spring Contact Probe, Wafer Probe Card and High Density Coaxial Cable
Ph) 702-242-1101   Fax) 702-388-1101  e-mail) info@qualmax.com

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