Total Solution for Semiconductor IC Test Socket, Spring Contact Probe, WLP Probe Card, ATE Load Board, Burn-in Test Scoket

What We Offer

Semiconductor Test Socket
Elastomeric sockets
Burn-in Test Socket
ATE Load Board
WLP Probe Card
Spring Contact Probe
Test Socket Lid
Custom Support Plate
Change Kit
Application Engineering
Free Custom Design
Technical Support
Local Stocking of Inventory
Supports JIT Manufacturing
Quality Standard Set-up

Our Commitment

Product Excellence
In-depth Application  Consulting
Intelligent Design Engineering
Precision Manufacturing
Stringent Quality Control 
Two-week Goal for ;
  - Design Completion
  - Prototype Delivery
  - Mass Production Delivery
No NRE Charge
No Tooling Charge
Flexible Approach
Goal Oriented Customer Care

Benefits for You

Highest Quality Product
Best Test Yield
Shortest Lead Time
Shortest Time-to-Market
Competitive Price
Intensive Local Support
One Stop Total Solution

 

Qualmax - Proven Full Service Company for Spring Contact Probe (Pogo Pin)

Dubble-ended Probe, Single-ended Probe, Solid Pd Alloy Probe, Constant Cres Probe,
Coaxial Probe, Kelvin Probe, Switching Probe, Touch Probe, GT Probe, Battery Contact,
Pneumatic Probe, Interface Probe, Industrial Application Probe, In-Circuit Test Probe

Single-ended Probe : GX Series

  • GX Types are 3-piece probes consisting of one movable plunger, a barrel and a miniature spring assembled into the barrel.
  • Custom designs are welcome
  • Just call us. We will design for you from your specification at no charge
  • Sample delivery within 2 weeks aro
  • Upto 0.4mm pitch
  • Barrel diameter as small as 0.28mm
  • Spring force as small as 15.08g
  • Following parts are just a show case

PART. NO Total length Pitch[mm(inch)] Barrel / Flange [mm(inch)] Spring Force [g(oz)]
GX397CAR-D 3.0mm
0.4 (0.0157) 0 .28 (0.011) / 0.33 (0.013)
16.5g(0.582oz) at 0.38mm
GX369AR2-D 2.7mm 0.5 (0.0197) 0.32 (0.013) / 0.41 (0.016) 27.2g(0.959oz) at 0.3mm
GX246CAR-D3 3.3mm 0.5 (0.0197) 0.32 (0.013) / 0.41 (0.016) 24.3g(0.857oz) at 0.38mm
GX319CAM-R1 1.55mm 0.75 (0.0295) 0.51 (0.0201) / 0.62 (0.0244) 20.0g(0.705oz) at 0.23mm
GX360AMAR-D 2.5mm 0.75 (0.0295) 0.52 (0.025) / 0.62 (0.0244) 30.9g(1.09oz) at 0.35mm
GX254CAR-D4 3.3mm 0.75 (0.0295) 0.52 (0.025) / 0.62 (0.0244) 34.7g(01.182oz) at 0.4mm
GX361AM2-D 3.65mm 0.75 (0.0295) 0.52 (0.025) / 0.62 (0.0244) 21.5g(0.758oz) at 0.7mm
GX359AM2-D 4.9mm 1.0 (0.0398) 0.64 (0.0252) / 0.80 (0.0315) 30.5g(1.076oz) at 0.80mm
GX366AMAR-D 4.46mm 1.0 (0.0398) 0.67 (0.0264) / 0.80 (0.0315) 39.9g(1.407oz) at 0.65mm
GX347AM2-D 3.3mm 1.0 (0.0398) 0.75 (0.0295) / 0.85 (0.0335) 30.0g(1.058oz) at 0.5mm
GX276AMAM-D 4.3mm 1.0 (0.0398) 0.75 (0.0295) / 0.85 (0.0335) 32.6g(1.149oz) at 0.8mm
GX275AMAM-D 4.8mm 1.27 (0.05) 0.85 (0.0335) / 1.0 (0.0394) 32.5g(1.1466oz) at 0.8mm

 

      

 

Special Sale:
See our inventory liquidation sale. Huge savings!

New Products

Micro Conctact Vertical Probe Card (MCVPC) for Wafer Level Package Test

Solid Pd Alloy Probes for Critical Lead Free Applications

RF Coaxial Test Socket

BK Series Elastomeric Socket     

Press Release:Qualmax now offers design engineering support in the U.S.

Download Qualmax Corporate Brochure

See us at International Test Conference 2010

See us at BITS 2010

 

Please e-mail to info@qualmax.com for your Semciconductor Test Socket or Spring Contact Probe needs.
Qualmax provides Semiconductor Test Socket, Spring Contact Probe, WLP Probe Card, Burn-in Test
Socket and ATE Load Board (DUT Board)  to the semiconductor test industry.

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