Total Solution for Semiconductor IC Test Socket, Spring Contact Probe, Wafer Probe Card and High Density Coaxial Connector

What We Offer

Semiconductor Test Socket
Wafer Probe Card
Spring Contact Probe
Test Socket Lid
Custom Support Plate
Hight Density Coaxial Connector
Application Engineering
Free Custom Design
Technical Support
Local Stocking of Inventory
Supports JIT Manufacturing
Quality Standard Set-up

Our Commitment

Product Excellence
In-depth Application  Consulting
Intelligent Design Engineering
Precision Manufacturing
Stringent Quality Control 
Two-week Goal for ;
  - Design Completion
  - Prototype Delivery
  - Mass Production Delivery
No NRE Charge
No Tooling Charge
Flexible Approach
Goal Oriented Customer Care 

Benefits for You

Highest Quality Product
Best Test Yield
Shortest Lead Time
Shortest Time-to-Market
Competitive Price
Intensive Local Support
One Stop Total Solution

 

 

 

 

 

 

 

 

 

 

 

 

 

 

  

 

Semiconductor IC Test Socket   Wafer Probe Card   Spring Contact Probe    High Density Coaxial Connector

 

The following products are on special sale to reduce excessive inventory.  This special sale is for a limited time only and does not reflect standard prices.  Quantities are also limited.   First come, first served while the inventory lasts. Drawings are for reference only, and the actual plunger tip style and the specification may be different from the drawing. If the part number is not exactly the same as that on the drawing, please consult Qualmax first before placing your order on-line. Shipping terms are FOB Henderson, NV, U.S.A.  Freight charges are the responsibility of the purchaser.   For our international customers, freight and applicable custom charges are also the responsibility of the purchaser. If an order is cancelled before shipment or returned within seven(7) days after the receipt of the product by the purchaser, a cancellation charge or restocking charge will be applied according to Qualmax' standard policy. Please ask Qualmax for the details. No cancellation or the return shipment will be accepted after seven(7) days from the receipt of the product by the purchaser.

 

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Drawing: G1003-SERIES.pdf
Part Number: G1003TW
In-circuit test probe
For in-circuit test fixture or other general use
Regular Price(ea)(U$): 0.22
Sale Price(ea) (U$): 0.10
Quantity Available (ea): 200
Total Length(mm): 39.00
Total Length(in): 1.535
Barrel Dia.(mm): 1.40
Barrel Dia.(in): 0.055
Spring Force(g): 0.0
Spring Force(oz): 0.000
Applicable Pitch(mm): 1.91
Applicable Pitch(in): 0.075
Drawing: G135-SERIES.pdf
Part Number: G135C25
In-circuit test probe
For in-circuit test fixture or other general use
Regular Price(ea)(U$): 0.53
Sale Price(ea) (U$): 0.22
Quantity Available (ea): 1410
Total Length(mm): 34.00
Total Length(in): 1.339
Barrel Dia.(mm): 2.50
Barrel Dia.(in): 0.098
Spring Force(g): 170.0
Spring Force(oz): 5.997
Applicable Pitch(mm): 2.54
Applicable Pitch(in): 0.100
Drawing: GL1003-SERIES.pdf
Part Number: GL1003
In-circuit test probe
For in-circuit test fixture or other general use
Regular Price(ea)(U$): 1.60
Sale Price(ea) (U$): 0.67
Quantity Available (ea): 99
Total Length(mm): 55.00
Total Length(in): 2.165
Barrel Dia.(mm): 1.20
Barrel Dia.(in): 0.047
Spring Force(g): 170.0
Spring Force(oz): 5.997
Applicable Pitch(mm): 1.91
Applicable Pitch(in): 0.075
Drawing: GL1003-SERIES.pdf
Part Number: GL1003C
In-circuit test probe
For in-circuit test fixture or other general use
Regular Price(ea)(U$): 1.30
Sale Price(ea) (U$): 0.55
Quantity Available (ea): 100
Total Length(mm): 55.00
Total Length(in): 2.165
Barrel Dia.(mm): 1.20
Barrel Dia.(in): 0.047
Spring Force(g): 170.0
Spring Force(oz): 5.997
Applicable Pitch(mm): 1.91
Applicable Pitch(in): 0.075
Drawing: GL1003-SERIES.pdf
Part Number: GL1003M
In-circuit test probe
For in-circuit test fixture or other general use
Regular Price(ea)(U$): 1.30
Sale Price(ea) (U$): 0.55
Quantity Available (ea): 100
Total Length(mm): 55.00
Total Length(in): 2.165
Barrel Dia.(mm): 1.20
Barrel Dia.(in): 0.047
Spring Force(g): 170.0
Spring Force(oz): 5.997
Applicable Pitch(mm): 1.91
Applicable Pitch(in): 0.075
Drawing: GL1003-SERIES.pdf
Part Number: GL1003U
In-circuit test probe
For in-circuit test fixture or other general use
Regular Price(ea)(U$): 1.30
Sale Price(ea) (U$): 0.55
Quantity Available (ea): 100
Total Length(mm): 55.00
Total Length(in): 2.165
Barrel Dia.(mm): 1.20
Barrel Dia.(in): 0.047
Spring Force(g): 170.0
Spring Force(oz): 5.997
Applicable Pitch(mm): 1.91
Applicable Pitch(in): 0.075

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Special Sale:
See our inventory liquidation sale. Huge savings!

New Products

Solid Pd Alloy Probes  

RF Coaxial Test Socket

Press Releases

Download Qualmax Corporate Brochure

Trade Shows

See us at BITS 2012

See us at SWTW 2012

 

 

Please e-mail to info@qualmax.com for your Semciconductor Test Socket or Spring Contact Probe needs.
Qualmax provides Semiconductor Test Socket, Spring Contact Probe and WLP Probe Card to the semiconductor test industry.

Qualmax, Inc., Qualmax America, Inc., All rights reserved. 2011-2012 e-mail: webmaster@qualmax.com