Total Solution for Semiconductor IC Test Socket, Spring Contact Probe, WLP Probe Card, ATE Load Board, Burn-in Test Scoket

What We Offer

Semiconductor Test Socket
Elastomeric sockets
Burn-in Test Socket
ATE Load Board
WLP Probe Card
Spring Contact Probe
Test Socket Lid
Custom Support Plate
Change Kit
Application Engineering
Free Custom Design
Technical Support
Local Stocking of Inventory
Supports JIT Manufacturing
Quality Standard Set-up

Our Commitment

Product Excellence
In-depth Application  Consulting
Intelligent Design Engineering
Precision Manufacturing
Stringent Quality Control 
Two-week Goal for ;
  - Design Completion
  - Prototype Delivery
  - Mass Production Delivery
No NRE Charge
No Tooling Charge
Flexible Approach
Goal Oriented Customer Care

Benefits for You

Highest Quality Product
Best Test Yield
Shortest Lead Time
Shortest Time-to-Market
Competitive Price
Intensive Local Support
One Stop Total Solution

 

The following products are on special sale to reduce excessive inventory.  This special sale is for a limited time only and does not reflect standard prices.  Quantities are also limited.   First come, first served while the inventory lasts. Drawings are for reference only, and the actual plunger tip style and the specification may be different from the drawing. If the part number is not exactly the same as that on the drawing, please consult Qualmax first before placing your order on-line. Shipping terms are FOB Henderson, NV, U.S.A.  Freight charges are the responsibility of the purchaser.   For our international customers, freight and applicable custom charges are also the responsibility of the purchaser. If an order is cancelled before shipment or returned within seven(7) days after the receipt of the product by the purchaser, a cancellation charge or restocking charge will be applied according to Qualmax' standard policy. Please ask Qualmax for the details. No cancellation or the return shipment will be accepted after seven(7) days from the receipt of the product by the purchaser.

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Drawing: SP100-series.pdf
Part Number: SP10001S0800
In-circuit test probe
For in-circuit test fixture or other general use
Regular Price(ea)(U$): 0.50
Sale Price(ea) (U$): 0.21
Quantity Available (ea): 1000
Total Length(mm): 33.27
Total Length(in): 1.310
Barrel Dia.(mm): 1.40
Barrel Dia.(in): 0.055
Spring Force(g): 229.0
Spring Force(oz): 8.078
Applicable Pitch(mm): 2.54
Applicable Pitch(in): 0.100
Drawing: SP100-series.pdf
Part Number: SP100080401
In-circuit test probe
For in-circuit test fixture or other general use
Regular Price(ea)(U$): 0.28
Sale Price(ea) (U$): 0.12
Quantity Available (ea): 4825
Total Length(mm): 33.27
Total Length(in): 1.310
Barrel Dia.(mm): 1.37
Barrel Dia.(in): 0.054
Spring Force(g):
Spring Force(oz): 0.000
Applicable Pitch(mm): 2.54
Applicable Pitch(in): 0.100
Drawing: SP100-series.pdf
Part Number: SP10008S0400
In-circuit test probe
For in-circuit test fixture or other general use
Regular Price(ea)(U$): 0.50
Sale Price(ea) (U$): 0.21
Quantity Available (ea): 4300
Total Length(mm): 33.27
Total Length(in): 1.310
Barrel Dia.(mm): 1.37
Barrel Dia.(in): 0.054
Spring Force(g): 118.0
Spring Force(oz): 4.162
Applicable Pitch(mm): 2.54
Applicable Pitch(in): 0.100
Drawing: SP100-series.pdf
Part Number: SP100120800
In-circuit test probe
For in-circuit test fixture or other general use
Regular Price(ea)(U$): 0.50
Sale Price(ea) (U$): 0.21
Quantity Available (ea): 1978
Total Length(mm): 33.27
Total Length(in): 1.310
Barrel Dia.(mm): 1.40
Barrel Dia.(in): 0.055
Spring Force(g): 229.0
Spring Force(oz): 8.078
Applicable Pitch(mm): 2.54
Applicable Pitch(in): 0.100
Drawing: SP100-series.pdf
Part Number: SP10012S0800
In-circuit test probe
For in-circuit test fixture or other general use
Regular Price(ea)(U$): 0.50
Sale Price(ea) (U$): 0.21
Quantity Available (ea): 472
Total Length(mm): 33.27
Total Length(in): 1.310
Barrel Dia.(mm): 1.40
Barrel Dia.(in): 0.055
Spring Force(g): 229.0
Spring Force(oz): 8.078
Applicable Pitch(mm): 2.54
Applicable Pitch(in): 0.100
Drawing: SP100-series.pdf
Part Number: SP100130800
In-circuit test probe
For in-circuit test fixture or other general use
Regular Price(ea)(U$): 0.50
Sale Price(ea) (U$): 0.21
Quantity Available (ea): 1791
Total Length(mm): 33.27
Total Length(in): 1.310
Barrel Dia.(mm): 1.37
Barrel Dia.(in): 0.054
Spring Force(g): 229.0
Spring Force(oz): 8.078
Applicable Pitch(mm): 2.54
Applicable Pitch(in): 0.100

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Special Sale:
See our inventory liquidation sale. Huge savings!

New Products

Micro Conctact Vertical Probe Card (MCVPC) for Wafer Level Package Test

Solid Pd Alloy Probes for Critical Lead Free Applications

RF Coaxial Test Socket

BK Series Elastomeric Socket     

Press Release:Qualmax now offers design engineering support in the U.S.

Download Qualmax Corporate Brochure

See us at International Test Conference 2010

See us at BITS 2010

 

Please e-mail to info@qualmax.com for your Semciconductor Test Socket or Spring Contact Probe needs.
Qualmax provides Semiconductor Test Socket, Spring Contact Probe, WLP Probe Card, Burn-in Test
Socket and ATE Load Board (DUT Board)  to the semiconductor test industry.

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