Total Solution for Semiconductor IC Test Socket, Spring Contact Probe, Wafer Probe Card and High Density Coaxial Connector

Qualmax - Full Proven Service Company for Semiconductor IC Test Sockets

 

Semiconductor IC Test Socket   Wafer Probe Card   Spring Contact Probe    High Density Coaxial Connector

The following products are on special sale to reduce excessive inventory.  This special sale is for a limited time only and does not reflect standard prices.  Quantities are also limited.   First come, first served while the inventory lasts. Drawings are for reference only, and the actual plunger tip style and the specification may be different from the drawing. If the part number is not exactly the same as that on the drawing, please consult Qualmax first before placing your order on-line. Shipping terms are FOB Henderson, NV, U.S.A.  Freight charges are the responsibility of the purchaser.   For our international customers, freight and applicable custom charges are also the responsibility of the purchaser. If an order is cancelled before shipment or returned within seven(7) days after the receipt of the product by the purchaser, a cancellation charge or restocking charge will be applied according to Qualmax' standard policy. Please ask Qualmax for the details. No cancellation or the return shipment will be accepted after seven(7) days from the receipt of the product by the purchaser.

 

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Drawing: GX777CAR-DS2808022029.pdf
Part Number: GX777CARDS
Single-ended Spring Probe
For semiconductor sockets
Regular Price(ea)(U$): 1.80
Sale Price(ea) (U$): 0.80
Quantity Available (ea): 31351
Total Length(mm): 4.80
Total Length(in): 0.189
Barrel Dia.(mm): 0.57
Barrel Dia.(in): 0.022
Spring Force(g): 21.0
Spring Force(oz): 0.741
Applicable Pitch(mm): 0.50
Applicable Pitch(in): 0.020

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Special Sale:
See our inventory liquidation sale. Huge savings!

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RF Coaxial Test Socket

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Please e-mail to info@qualmax.com for your Semciconductor Test Socket or Spring Contact Probe needs.
Qualmax provides Semiconductor Test Socket, Spring Contact Probe and WLP Probe Card to the semiconductor test industry.