Total Solution for Semiconductor IC Test Socket, Spring Contact Probe, WLP Probe Card, ATE Load Board, Burn-in Test Scoket

Qualmax - Full Proven Service Company for Semiconductor IC Test Socket

BGA Socket / LGA SocketRF Device SocketSpecial SocketQFN Socket / MLF SocketPOP Socket /
PIP Socket
QFP SocketMemory Device SocketElastomeric Socket, Contactor LidCustom Support Plate, Change Kit 

Special Custom Socket

Graphic Card Test Socket   GDDR3 Graphic Card Test Socket


Specification of GDDR3 Graphic Card Test Socket     
Graphic Card (GDDR3) Test Socket


DMB Tuner Module Test Socket  
DMB Tuner Module Test Socket



connector test socket 
Connector Test Socket
Test Connector Brand: Matshushita, Kyocera, Molex, Hirose and others
Test Pin Count: 4 to 80 pins
Test Pitch: 0.30mm to 0.50mm

 

Qualmax also offers Burn-in Test Socket, ATE Test Board (DUT Board), WLP Probe Card and wide
range of
Spring Contact Probe.

     

 

Special Sale:
See our inventory liquidation sale. Huge savings!

New Products

Micro Conctact Vertical Probe Card (MCVPC) for Wafer Level Package Test

Solid Pd Alloy Probes for Critical Lead Free Applications

RF Coaxial Test Socket

BK Series Elastomeric Socket     

Press Release:Qualmax now offers design engineering support in the U.S.

Download Qualmax Corporate Brochure

See us at International Test Conference 2010

See us at BITS 2010

 

Please e-mail to info@qualmax.com for your Semciconductor Test Socket or Spring Contact Probe needs.
Qualmax provides Semiconductor Test Socket, Spring Contact Probe, WLP Probe Card, Burn-in Test
Socket
and ATE Load Board (DUT Board)  to the semiconductor test industry.