Total Solution for Semiconductor IC Test Socket, Spring Contact Probe, WLP Probe Card, ATE Load Board, Burn-in Test Scoket

About Qualmax

Spring Contact Probe Double-ended Probe Single-ended Probe Solid Pd Alloy Probe Constant Cres Probe Coaxial Probe Kelvin Probe Switching Probe Touch Probe GT Probe Battery Contact Probe Pneumatic Probe Interface Probe Industrial Applications In-circuit Test Probe Pogo Pin Search

Semiconductor Test Socket

Burn-in Test Socket

ATE Load Board

WLP Probe Card

What We Offer

Semiconductor Test Socket
Elastomeric sockets
Burn-in Test Socket
ATE Load Board
WLP Probe Card
Spring Contact Probe
Test Socket Lid
Custom Support Plate
Change Kit
Application Engineering
Free Custom Design
Technical Support
Local Stocking of Inventory
Supports JIT Manufacturing
Quality Standard Set-up

Our Commitment

Product Excellence
In-depth Application Consulting
Intelligent Design Engineering
Precision Manufacturing
Stringent Quality Control
Two-week Goal for ;
- Design Completion
- Prototype Delivery
- Mass Production Delivery
No NRE Charge
No Tooling Charge
Flexible Approach
Goal Oriented Customer Care

Benefits for You

Highest Quality Product
Best Test Yield
Shortest Lead Time
Shortest Time-to-Market
Competitive Price
Intensive Local Support
One Stop Total Solution

Qualmax - The best source of high quality Spring Contact Probe (Pogo Pin)

Spring Contact Probe Product Line

Qualmax offers variety of spring contact probes for different applications.

Double-ended Probe, Single-ended Probe, Solid Pd Alloy Probe, Constant Cres Probe,
Coaxial Probe, Kelvin Probe, Switching Probe, Touch Probe, GT Probe, Battery Contact,
Pneumatic Probe, Interface Probe, Industrial Application Probe, In-Circuit Test Probe

Features

Over 20,000 different models have developed
Customs designs are welcome
Design support from specification or concept drawing
No NRE or tooling charge
Delivery of prototype sample within 2 weeks upon drawing approval
Delivery of production order within 1 to 2 weeks ARO, upto 300,000 pcs
Min pitch : 0.12mm
Min signal path length : <1.0mm
Operation Temperature: -55 deg C to +150 deg C
Insertion: >500,000 times
Typical resistance: <50 mOhms
Current carrying capacity: upto 15 amps
100% inspection before shipment
100% in-house manufacturing, no outsourcing at all in any aspect of manufacturing process

double-ended spring contact probes single-ended spring contact probes
Spring Contact Probe Samples

spring contact probe tester x-ray inspection of spring contact probes
Probe Tester X-Ray Inspection Energy Dispersive X-Ray Spectrometer

spring contact probe test block automic force microscope to inspect spring contact probes SEM picture of spring contact probe tip
Probe Test Board Atomic Force Microscope SEM

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Special Sale:
See our inventory liquidation sale. Huge savings!

New Products

Micro Conctact Vertical Probe Card (MCVPC) for Wafer Level Package Test

Solid Pd Alloy Probes for Critical Lead Free Applications

RF Socket

BK Series Elastomeric Socket

Press Release:Qualmax now offers design engineering support in the U.S.

Download Qualmax Corporate Brochure

See us at International Test Conference 2009

See us at BITS 2010

Please e-mail to info@qualmax.com for your Semciconductor Test Socket or Spring Contact Probe needs.
Qualmax provides Semiconductor Test Socket, Spring Contact Probe, WLP Probe Card, Burn-in Test
Socket and ATE Load Board (DUT Board) to the semiconductor test industry.