Total Solution for Semiconductor IC Test Socket, Spring Contact Probe, WLP Probe Card, ATE Load Board, Burn-in Test Scoket

Qualmax offers Spring Contact Probe for Signal Switching Applications

Double-ended Probe, Single-ended Probe, Solid Pd Alloy Probe, Constant Cres Probe,
Coaxial Probe, Kelvin Probe, Switching Probe, Touch Probe, GT Probe, Battery Contact,
Pneumatic Probe, Interface Probe, Industrial Application Probe, In-Circuit Test Probe

Switching Probe

Switching probe is used in the automatic electrical continuity testing of electrical

equipment such as cable harnesses commonly used in the automobile industry.

A typical switching probe is a miniature-sized device which includes a barrel, an insulator,

a terminal in one end of the barrel isolated by the insulator, a movable plunger

projecting from the opposite from the end of the barrel, and a coil spring inside the

barrel between the plunger and the terminal. 

 

Leeno Switch Probes are manufactured under the same Stringent quality control

procedure as seen in the manufacturing of semiconductor probes,  and are field

proven by a few of the world's largest cable harness manufacturers. Switching path
is as short as 2.0mm (0.079"), which makes it perfect choice for electrical presence test
in tight space. Current rating is 10A continuous.

 

 

pictureof switching probe

   

 

Special Sale:
See our inventory liquidation sale. Huge savings!

New Products

Micro Conctact Vertical Probe Card (MCVPC) for Wafer Level Package Test

Solid Pd Alloy Probes for Critical Lead Free Applications

RF Coaxial Test Socket

BK Series Elastomeric Socket     

Press Release:Qualmax now offers design engineering support in the U.S.

Download Qualmax Corporate Brochure

See us at International Test Conference 2010

See us at BITS 2010

 

Please e-mail to info@qualmax.com for your Semciconductor Test Socket or Spring Contact Probe needs.
Qualmax provides Semiconductor Test Socket, Spring Contact Probe, WLP Probe Card, Burn-in Test
Socket
and ATE Load Board (DUT Board)  to the semiconductor test industry.